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Thesis

Functional nanolayer dielectrics for improved semiconductor devices

Abstract:

Negatively charged dielectric films have significant potential to improve the performance of semiconductor devices by modifying its carrier densities. Such charges can be embedded by injecting electrons to dielectric defects, which can be intentionally engineered to control their density and location for specific applications. Understanding the interactions at the charged dielectrics and semiconductor interfaces is also essential for effective integration into devices.

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author

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Role:
Supervisor
ORCID:
0000-0002-5395-5850
Role:
Examiner
Role:
Examiner


DOI:
Type of award:
DPhil
Level of award:
Doctoral
Awarding institution:
University of Oxford

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