- Abstract:
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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000+
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- Publication date:
- 2011
- Type of award:
- DPhil
- Level of award:
- Doctoral
- URN:
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uuid:f0e4b8ff-f563-429e-9e71-9c277a5139c4
- Local pid:
- ora:6133
- Copyright holder:
- Joanna Lee
- Copyright date:
- 2011
Thesis
Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis
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