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Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis

Abstract:

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000+

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Institution:
University of Oxford
Department:
Mathematical,Physical & Life Sciences Division - Materials

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Role:
Supervisor
Role:
Supervisor
Publication date:
2011
Type of award:
DPhil
Level of award:
Doctoral
URN:
uuid:f0e4b8ff-f563-429e-9e71-9c277a5139c4
Local pid:
ora:6133

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