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Thesis

Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis

Abstract:

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000+

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author

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Division:
MPLS
Department:
Materials
Role:
Supervisor
Division:
MPLS
Department:
Materials
Role:
Supervisor
Publication date:
2011
Type of award:
DPhil
Level of award:
Doctoral
Awarding institution:
University of Oxford

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