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Journal article

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

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Publisher copy:
10.1017/S1431927608086856

Authors


Trager-Cowan, C More by this author
Edwards, PR More by this author
Dynowski, FL More by this author
Sweeney, F More by this author
Wilkinson, AJ More by this author
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Journal:
Microscopy and Microanalysis
Volume:
14
Issue:
SUPPL. 2
Pages:
1194-1195
Publication date:
2008-08-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:eb08cff3-9adc-426b-a4c4-0187d7be8ded
Source identifiers:
291985
Local pid:
pubs:291985

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