Journal article
Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
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Authors
- Journal:
- Microscopy and Microanalysis More from this journal
- Volume:
- 14
- Issue:
- SUPPL. 2
- Pages:
- 1194-1195
- Publication date:
- 2008-08-01
- DOI:
- EISSN:
-
1435-8115
- ISSN:
-
1431-9276
- Pubs id:
-
pubs:291985
- UUID:
-
uuid:eb08cff3-9adc-426b-a4c4-0187d7be8ded
- Local pid:
-
pubs:291985
- Source identifiers:
-
291985
- Deposit date:
-
2013-11-17
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- Copyright date:
- 2008
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