Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films (Microscopy and Microanalysis, 2008)

(untitled) - Trager-Cowan, C; Edwards, P; Dynowski, F; Sweeney, F; Wilkinson, A; Winkelmann, A; Day, A; Wang, T; Parbrook, P; Watson, I; Joy, D