Thesis
A unified approach to crack fields and crack propagation
- Abstract:
- Understanding the mechanical behaviour of materials requires detailed characterisation of crack-tip fields and propagation mechanisms, particularly at small length scales. This thesis develops a generalised, field-based methodology for evaluating fracture parameters and propagation mechanisms using full-field techniques including optical DIC, SEM-DIC, and HR-EBSD. A literature review traces the development of fracture mechanics from global, geometry-based fracture toughness concepts to local, field-based approaches, highlighting the limitations of conventional methods for short fatigue cracks and microscale testing. The first study analyses short fatigue cracks in Zircaloy-4 using high-resolution optical DIC, confirming the feasibility of extracting fracture parameters from field data and showing that short fatigue cracks exhibit distinct crack-tip driving force characteristics. The method is then extended to single crystal nickel-alloy, where concurrent SEM-DIC and HR-EBSD capture both displacement and lattice strain fields of a short fatigue crack in situ for the first time, enabling direct evaluation of energy integrals from measured data. Finally, a microscale fracture toughness testing method based on indentation cracking in silicon integrates HR-EBSD strain mapping and energy-based analysis to extract mode-specific stress intensity factors, retaining the practicality of indentation testing while enhancing its interpretability. Overall, the work offers a robust alternative to classical approaches, grounded in full-field local measurements.
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- Files:
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(Preview, Dissemination version, pdf, 9.9MB, Terms of use)
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Authors
Contributors
+ Marrow, T
- Institution:
- University of Oxford
- Division:
- MPLS
- Department:
- Materials
- Role:
- Supervisor
- ORCID:
- 0000-0001-6120-9826
- DOI:
- Type of award:
- DPhil
- Level of award:
- Doctoral
- Awarding institution:
- University of Oxford
- Language:
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English
- Keywords:
- Subjects:
- Deposit date:
-
2026-06-19
- ARK identifier:
Terms of use
- Copyright holder:
- Xiao Su
- Copyright date:
- 2025
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