Thesis
High-resolution electron microscopy of dislocation geometries
- Abstract:
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Conventional strong-beam imaging techniques have been widely applied in the study of crystal defects, the main advantage being the high intensity of the images which reduces photographic exposure times to a few seconds at most, thus avoiding problems of drift and contamination. However, such images have the disadvantage of not being related in any simple way to the defect geometry, and they are relatively insensitive to small changes in the strain field. The width of a peak from a dislocat...
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(Preview, pdf, 4.3MB, Terms of use)
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Authors
- DOI:
- Type of award:
- DPhil
- Level of award:
- Doctoral
- Awarding institution:
- University of Oxford
- UUID:
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uuid:411d4a49-b58f-4782-ac16-7bca69a7dfa7
- Local pid:
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polonsky:7:42
- Source identifiers:
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601870445
- Deposit date:
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2017-10-05
- ARK identifier:
Terms of use
- Copyright holder:
- Holmes, S; Holmes, S M
- Copyright date:
- 1975
- Notes:
- This thesis was digitised thanks to the generosity of Dr Leonard Polonsky
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