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Probabilistic novelty detection with support vector machines

Abstract:
Novelty detection, or one-class classification, is of particular use in the analysis of high-integrity systems, in which examples of failure are rare in comparison with the number of examples of stable behaviour, such that a conventional multi-class classification approach cannot be taken. Support Vector Machines (SVMs) are a popular means of performing novelty detection, and it is conventional practice to use a train-validate-test approach, often involving cross-validation, to train the one-class SVM, and then select appropriate values for its parameters. An alternative method, used with multi-class SVMs, is to calibrate the SVM output into conditional class probabilities. A probabilistic approach offers many advantages over the conventional method, including the facility to select automatically a probabilistic novelty threshold. The contributions of this paper are (i) the development of a probabilistic calibration technique for one-class SVMs, such that on-line novelty detection may be performed in a probabilistic manner; and (ii) the demonstration of the advantages of the proposed method (in comparison to the conventional one-class SVM methodology) using case studies, in which one-class probabilistic SVMs are used to perform condition monitoring of a high-integrity industrial combustion plant, and in detecting deterioration in patient physiological condition during patient vital-sign monitoring. © 2014 IEEE.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1109/TR.2014.2315911

Authors


More by this author
Institution:
University of Oxford
Division:
MSD
Department:
NDORMS
Sub department:
Centre for Statistics in Medicine
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MSD
Department:
Clinical Neurosciences
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author


Publisher:
Institute of Electrical and Electronics Engineers
Journal:
IEEE Transactions on Reliability More from this journal
Volume:
63
Issue:
2
Pages:
455-467
Publication date:
2014-06-01
DOI:
EISSN:
1558-1721
ISSN:
0018-9529


Keywords:
Pubs id:
pubs:471819
UUID:
uuid:3cf37979-a4ac-4b47-8ad1-501f63acc8a0
Local pid:
pubs:471819
Source identifiers:
471819
Deposit date:
2016-01-18

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