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Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi

Abstract:
We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40-nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field distribution sampled by the muon, along with evidence for magnetic transitions around T≈40 and 30 K. Our results suggest that the cone phase is not the only magnetic texture realized in film samples for out-of-plane fields.
Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1103/PhysRevB.93.140412

Authors


Lancaster, T More by this author
Thomas, IO More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
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Engineering and Physical Sciences Research Council More from this funder
John Templeton Foundation More from this funder
Publisher:
American Physical Society Publisher's website
Journal:
Physical Review B: Condensed Matter and Materials Physics Journal website
Volume:
93
Issue:
14
Pages:
Article: 140412(R)
Publication date:
2016
DOI:
ISSN:
1550-235X
URN:
uuid:2864b86d-fad6-4e84-8159-631ed3a36bc1
Source identifiers:
617814
Local pid:
pubs:617814

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