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Tomographic refractive index profiling of direct laser written waveguides

Abstract:

The fabrication of complex integrated photonic devices via direct laser writing is a powerful and rapidly developing technology. However, the approach is still facing several challenges. One of them is the reliable quantitative characterization of refractive index (RI) changes induced upon laser exposure. To this end, we develop a tomographic reconstruction algorithm following a modern optimization approach, relying on accelerated proximal gradient descent, based on intensity images only. Ver...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1364/oe.434846

Authors


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Role:
Author
ORCID:
0000-0003-3846-3273
More by this author
Role:
Author
ORCID:
0000-0002-8072-8768
Publisher:
The Optical Society Publisher's website
Journal:
Optics Express Journal website
Volume:
29
Issue:
22
Pages:
35414-35414
Publication date:
2021-10-14
Acceptance date:
2021-09-17
DOI:
EISSN:
1094-4087
Language:
English
Keywords:
Pubs id:
1209002
Local pid:
pubs:1209002
Deposit date:
2021-11-12

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