This thesis examines the effects of noise and interference on the performance of NAND flash memory.
Chapter 3 studies the probabilistic input/output relation between the data stored and the read threshold voltage of a cell and generalizes it to a group of cells. It is then concluded that adjacent cells are correlated due to common aggressors. This motivates the study of adequate signal processing techniques to optimize the reliability performance.
Chapter 4 proposes two tec...Expand abstract
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- University of Oxford
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Modeling and signal processing for flash memory
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