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Temperature-dependence of charge and exciton transport in one-dimensional systems subject to static and dynamic disorder

Abstract:
The temperature-dependence of dynamical properties (e.g., the asymptotic diusion coecient and the sub-diusive exponent) are calculated for charges and excitons in one-dimensional systems subject to static and dynamic disorder. These properties are determined by three complementary methods. One approach is via the time-integration of the velocity autocorrelation function. The second is via the mean-squared-displacement of thermal wavepackets subject to stochastic collapse via Lindblad jump operators. These two methods are applicable in the high-temperature regime, where the noise is temporally uncorrelated. In this regime the noise causes particle localization and the transport is diusive. The third approach applicable in the low-temperature regime is weak-coupling Redeld theory. Here, static disorder causes Anderson localization. When the dynamics is diusive, the diusion coe- cient is a non-monotonic function of temperature, increasing with temperature in the low-temperature Environment Assisted Quantum Transport (ENAQT) regime and decreasing with temperature in the high-temperature Quantum-Zeno (QZ) regime. For any temperature, static disorder decreases the diusion coecient. Increasing the dephasing factor increases the diusion coecient in the ENAQT regime, whereas the diusion coecient decreases in the QZ regime. The dynamics is non-diusive for thermal energies deep within the manifold of local-ground-states, where the subdiusive exponent decreases with increasing disorder and decreasing temperature.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/5.0314710

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Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Sub-Department of Physical and Theoretical Chemistry
Role:
Author


Publisher:
American Institute of Physics
Journal:
Journal of Chemical Physics More from this journal
Volume:
164
Issue:
4
Article number:
044111
Publication date:
2026-01-23
Acceptance date:
2026-01-07
DOI:
EISSN:
1089-7690
ISSN:
0021-9606


Language:
English
Pubs id:
2357249
Local pid:
pubs:2357249
Deposit date:
2026-01-09
ARK identifier:

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