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Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy

Abstract:
Dynamic processes, such as solid-state chemical reactions and phase changes, are ubiquitous in materials science and developing a capability to observe the mechanisms of such processes on the atomic scale can offer new insights across a wide range of materials systems. Aberration correction in scanning transmission electron microscopy (STEM) has enabled atomic resolution imaging at significantly reduced beam energies and electron doses. It has also made possible the quantitative determination of the composition and occupancy of atomic columns using the atomic number (Z)-contrast annular dark-field (ADF) imaging available in STEM. Here we combine these benefits to record the motions and quantitative changes in the occupancy of individual atomic columns during a solid-state chemical reaction in manganese oxides. These oxides are of great interest for energy-storage applications such as for electrode materials in pseudocapacitors. We employ rapid scanning in STEM to both drive and directly observe the atomic scale dynamics behind the transformation of Mn3O4 into MnO. The results demonstrate we now have the experimental capability to understand the complex atomic mechanisms involved in phase changes and solid state chemical reactions.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1038/srep07555

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Publisher:
Springer Nature
Journal:
Scientific Reports More from this journal
Volume:
4
Article number:
7555
Publication date:
2014-12-22
Acceptance date:
2014-11-07
DOI:
EISSN:
2045-2322


Language:
English
Keywords:
Pubs id:
pubs:500989
UUID:
uuid:fe1ddc0c-9a38-4855-b0e9-4eec46d25eb4
Local pid:
pubs:500989
Source identifiers:
500989
Deposit date:
2014-12-28

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