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High Purity GaAs Nanowires Free of Planar Defects: Growth and Characterization

Abstract:
We investigate how to tailor the structural, crystallographic and optical properties of GaAs nanowires. Nanowires were grown by Au nanoparticle-catalyzed metalorganic chemical vapor deposition. A high arsine flow rate, that is, a high ratio of group V to group III precursors, imparts significant advantages. It dramatically reduces planar crystallographic defects and reduces intrinsic carbon dopant incorporation. Increasing V/III ratio further, however, instigates nanowire kinking and increases nanowire tapering. By choosing an intermediate V/III ratio we achieve uniform, vertically aligned GaAs nanowires, free of planar crystallographic defects, with excellent optical properties and high purity. These findings will greatly assist the development of future GaAs nanowire-based electronic and optoelectronic devices, and are expected to be more broadly relevant to the rational synthesis of other III-V nanowires. © 2008 WILEY-VCH Verlag GmbH and Co. KGaA.
Publication status:
Published

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Publisher copy:
10.1002/adfm.200800625

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author


Journal:
ADVANCED FUNCTIONAL MATERIALS More from this journal
Volume:
18
Issue:
23
Pages:
3794-3800
Publication date:
2008-12-08
DOI:
EISSN:
1616-3028
ISSN:
1616-301X


Language:
English
Pubs id:
pubs:158348
UUID:
uuid:fe0082f9-1d4e-4d48-ada7-55b6675b9da1
Local pid:
pubs:158348
Source identifiers:
158348
Deposit date:
2012-12-19

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