Journal article

ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON

Publication status:: Published

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APA Style

King, R., Mackenzie, R., Smith, G., & Cade, N. (1994). ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON. JOURNAL OF VACUUM SCIENCE and TECHNOLOGY B, 12(2), 705–709.

MLA Style

King, R., et al. “ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON.” JOURNAL OF VACUUM SCIENCE and TECHNOLOGY B, vol. 12, no. 2, 1994, pp. 705–09.

Chicago Style

King, R, R Mackenzie, G Smith, and N Cade. 1994. “ATOM-PROBE ANALYSIS AND FIELD-EMISSION STUDIES OF SILICON.” JOURNAL OF VACUUM SCIENCE and TECHNOLOGY B 12 (2): 705–9.
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Publisher copy:: 10.1116/1.587376

Authors

+ King, R More by this author

Role:: Author

+ Mackenzie, R More by this author

Role:: Author

+ Smith, G More by this author

Role:: Author

+ Cade, N More by this author

Role:: Author

Journal:: JOURNAL OF VACUUM SCIENCE and TECHNOLOGY B More from this journal
Volume:: 12
Issue:: 2
Pages:: 705-709
Publication date:: 1994-01-01
DOI:: 10.1116/1.587376
ISSN:: 1071-1023

Pubs id:: pubs:17071
UUID:: uuid:fd7b3693-f7b2-4c31-93e2-2ad859165ef9
Local pid:: pubs:17071
Source identifiers:: 17071
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1994

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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