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Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.

Abstract:

Recent advances using cross-correlation analysis of full resolution high quality electron backscatter diffraction (EBSD) patterns have provided a method for quantitatively mapping the stored dislocation density at high spatial resolution. Larger areas could be mapped with image binning or coarser step sizes. We have studied the effects of image binning and step size on the recovery of GND density. Our results suggest that: (i) the measured lower bound GND density noise floor broadly agrees wi...

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Publication status:
Published

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Journal:
Ultramicroscopy More from this journal
Volume:
125
Pages:
1-9
Publication date:
2013-02-01
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
Language:
English
Keywords:
Pubs id:
pubs:369838
UUID:
uuid:fb9175d8-7121-42f8-8510-8b676638cd53
Local pid:
pubs:369838
Source identifiers:
369838
Deposit date:
2013-11-16

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