Journal article
Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit
- Abstract:
- We demonstrate that electron ptychographic phase reconstruction can recover spatial frequencies higher than those directly recorded in the experimental electron diffraction patterns. This ability to recover high angle information from the oversampled low angle information allows an annular detector to be inserted which partially shadows a lower pixelated detector to simultaneously record a conventional annular dark field image and a ptychographic dataset. We apply this approach to 30 keV imaging of monolayer molybdenum disulfide and achieve an Abbe limited resolution of 1.2 ± 0.1Å in our reconstructions.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 1.1MB, Terms of use)
-
- Publisher copy:
- 10.1063/5.0143684
Authors
- Publisher:
- AIP Publishing
- Journal:
- Applied Physics Letters More from this journal
- Volume:
- 123
- Issue:
- 2
- Article number:
- 023101
- Publication date:
- 2023-07-11
- Acceptance date:
- 2023-06-20
- DOI:
- EISSN:
-
1077-3118
- ISSN:
-
0003-6951
- Language:
-
English
- Keywords:
- Pubs id:
-
1492513
- Local pid:
-
pubs:1492513
- Deposit date:
-
2023-07-14
- ARK identifier:
Terms of use
- Copyright holder:
- Allen et al
- Copyright date:
- 2023
- Rights statement:
- © 2023 Author(s). Published under an exclusive license by AIP Publishing.
- Notes:
- This is the accepted manuscript version of the article. The final version is available online from AIP Publishing at: https://doi.org/10.1063/5.0143684
If you are the owner of this record, you can report an update to it here: Report update to this record