Journal article
Analytical STEM study of dy-doped Bi2Te3 thin films
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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(Preview, Accepted manuscript, pdf, 290.7KB, Terms of use)
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- Publisher copy:
- 10.1002/9783527808465.emc2016.6270
Authors
- Publisher:
- Wiley
- Journal:
- European Microscopy Congress 2016: Proceedings More from this journal
- Pages:
- 1050-1051
- Publication date:
- 2016-12-20
- Acceptance date:
- 2016-12-10
- DOI:
- Keywords:
- Pubs id:
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pubs:1059343
- UUID:
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uuid:fa962bb9-cb51-495b-bea5-dc183e7ad111
- Local pid:
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pubs:1059343
- Source identifiers:
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1059343
- Deposit date:
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2019-10-06
Terms of use
- Copyright date:
- 2016
- Notes:
- © 2016 Wiley‐VCH Verlag GmbH and Co. KGaA. All rights reserved. This is the accepted manuscript version of the article. The final version of the article is available from Wiley at: https://doi.org/10.1002/9783527808465.EMC2016.6270
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