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Journal article

Analytical STEM study of dy-doped Bi2Te3 thin films

Publication status:
Published
Peer review status:
Peer reviewed

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Files:
Publisher copy:
10.1002/9783527808465.emc2016.6270

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Publisher:
Wiley
Journal:
European Microscopy Congress 2016: Proceedings More from this journal
Pages:
1050-1051
Publication date:
2016-12-20
Acceptance date:
2016-12-10
DOI:
Keywords:
Pubs id:
pubs:1059343
UUID:
uuid:fa962bb9-cb51-495b-bea5-dc183e7ad111
Local pid:
pubs:1059343
Source identifiers:
1059343
Deposit date:
2019-10-06

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