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THERMAL-SHOCK RESISTANCE AND BENDING STRAIN TOLERANCE OF ELECTROPHORETICALLY DEPOSITED BI2SR2CACU2OY/AG TAPES

Abstract:
The degradation in 77 K self-field critical current density (Jc) of electrophoretically deposited Bi-2212/Ag tapes has been evaluated separately for thermal cycling (320-77 K), bending in compression, tension and combined compression-tension. After 11 repetitions of 320-77 K thermal cycles, (Jc) is reduced to 75-80% of its original value. A greater number of cycles resulted in no further degradation. The bending strain tolerance depends not only on bending strain, but also on the thickness of superconducting layers and the sense of bending. The superconducting layers show greater tolerance to compressive than tensile bending strain. Strain tolerance increases as layer thickness decreases. 13 μm layers can withstand strain of 0.2% without degradation in (Jc). © 1995.
Publication status:
Published

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Publisher copy:
10.1016/0167-577X(95)00114-X

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Journal:
MATERIALS LETTERS More from this journal
Volume:
24
Issue:
5
Pages:
271-274
Publication date:
1995-08-01
DOI:
ISSN:
0167-577X


Language:
English
Pubs id:
pubs:19278
UUID:
uuid:f883fdb6-4116-4339-b4cf-c794b1c6f787
Local pid:
pubs:19278
Source identifiers:
19278
Deposit date:
2012-12-19
ARK identifier:

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