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THERMAL-SHOCK RESISTANCE AND BENDING STRAIN TOLERANCE OF ELECTROPHORETICALLY DEPOSITED BI2SR2CACU2OY/AG TAPES

Abstract:

The degradation in 77 K self-field critical current density (Jc) of electrophoretically deposited Bi-2212/Ag tapes has been evaluated separately for thermal cycling (320-77 K), bending in compression, tension and combined compression-tension. After 11 repetitions of 320-77 K thermal cycles, (Jc) is reduced to 75-80% of its original value. A greater number of cycles resulted in no further degradation. The bending strain tolerance depends not only on bending strain, but also on the thickness of...

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Publication status:
Published

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Journal:
MATERIALS LETTERS More from this journal
Volume:
24
Issue:
5
Pages:
271-274
Publication date:
1995-08-01
DOI:
ISSN:
0167-577X
Language:
English
Pubs id:
pubs:19278
UUID:
uuid:f883fdb6-4116-4339-b4cf-c794b1c6f787
Local pid:
pubs:19278
Source identifiers:
19278
Deposit date:
2012-12-19

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