Journal article
THERMAL-SHOCK RESISTANCE AND BENDING STRAIN TOLERANCE OF ELECTROPHORETICALLY DEPOSITED BI2SR2CACU2OY/AG TAPES
- Abstract:
- The degradation in 77 K self-field critical current density (Jc) of electrophoretically deposited Bi-2212/Ag tapes has been evaluated separately for thermal cycling (320-77 K), bending in compression, tension and combined compression-tension. After 11 repetitions of 320-77 K thermal cycles, (Jc) is reduced to 75-80% of its original value. A greater number of cycles resulted in no further degradation. The bending strain tolerance depends not only on bending strain, but also on the thickness of superconducting layers and the sense of bending. The superconducting layers show greater tolerance to compressive than tensile bending strain. Strain tolerance increases as layer thickness decreases. 13 μm layers can withstand strain of 0.2% without degradation in (Jc). © 1995.
- Publication status:
- Published
Actions
Access Document
- Publisher copy:
- 10.1016/0167-577X(95)00114-X
Authors
- Journal:
- MATERIALS LETTERS More from this journal
- Volume:
- 24
- Issue:
- 5
- Pages:
- 271-274
- Publication date:
- 1995-08-01
- DOI:
- ISSN:
-
0167-577X
- Language:
-
English
- Pubs id:
-
pubs:19278
- UUID:
-
uuid:f883fdb6-4116-4339-b4cf-c794b1c6f787
- Local pid:
-
pubs:19278
- Source identifiers:
-
19278
- Deposit date:
-
2012-12-19
- ARK identifier:
Terms of use
- Copyright date:
- 1995
If you are the owner of this record, you can report an update to it here: Report update to this record