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Imaging crystallographic phases using time-of-flight neutron diffraction

Abstract:
Identification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases along the incident beam path through the thickness of the material to be reconstructed. Phase reconstruction is demonstrated on a benchmark object. © 2006 Elsevier B.V. All rights reserved.
Publication status:
Published

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Publisher copy:
10.1016/j.physb.2006.05.409

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Condensed Matter Physics
Role:
Author
Host title:
PHYSICA B-CONDENSED MATTER
Volume:
385-86
Pages:
1203-1205
Publication date:
2006-11-15
DOI:
ISSN:
0921-4526
Keywords:
Pubs id:
pubs:66318
UUID:
uuid:f7bc0e69-1f9c-4b05-bef7-bd73c2da1d22
Local pid:
pubs:66318
Source identifiers:
66318
Deposit date:
2012-12-19

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