Conference item
Defect imaging and channeling studies using channeling scanning transmission ion microscopy
- Abstract:
-
The technique of channeling scanning transmission ion microscopy (CSTIM) can be used to produce images of individual crystal defects (such as dislocations and stacking faults) using the scanned, focused ion beam from a nuclear microprobe. As well as offering a new method for studies of crystal defects, this technique can be used to investigate the effects of single defects on the channeling process. This paper describes some of the characteristics of the CSTIM technique, such as its ability t...
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- Publication status:
- Published
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- Publisher copy:
- 10.1016/0168-583X(95)01091-2
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Bibliographic Details
- Journal:
- NUCLEAR INSTRUMENTS and METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
- Volume:
- 118
- Issue:
- 1-4
- Pages:
- 426-430
- Publication date:
- 1996-09-01
- Event title:
- 12th International Conference on Ion Beam Analysis (IBA-12)
- DOI:
- ISSN:
-
0168-583X
- Source identifiers:
-
23253
Item Description
- Keywords:
- Pubs id:
-
pubs:23253
- UUID:
-
uuid:f799382a-5ba7-43e0-98d1-a3d45811cff8
- Local pid:
- pubs:23253
- Deposit date:
- 2012-12-19
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- Copyright date:
- 1996
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