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Defect imaging and channeling studies using channeling scanning transmission ion microscopy

Abstract:

The technique of channeling scanning transmission ion microscopy (CSTIM) can be used to produce images of individual crystal defects (such as dislocations and stacking faults) using the scanned, focused ion beam from a nuclear microprobe. As well as offering a new method for studies of crystal defects, this technique can be used to investigate the effects of single defects on the channeling process. This paper describes some of the characteristics of the CSTIM technique, such as its ability t...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Volume:
118
Issue:
1-4
Pages:
426-430
Publication date:
1996-09-05
DOI:
ISSN:
0168-583X
URN:
uuid:f799382a-5ba7-43e0-98d1-a3d45811cff8
Source identifiers:
23253
Local pid:
pubs:23253
Keywords:

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