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Defect imaging and channeling studies using channeling scanning transmission ion microscopy

Abstract:

The technique of channeling scanning transmission ion microscopy (CSTIM) can be used to produce images of individual crystal defects (such as dislocations and stacking faults) using the scanned, focused ion beam from a nuclear microprobe. As well as offering a new method for studies of crystal defects, this technique can be used to investigate the effects of single defects on the channeling process. This paper describes some of the characteristics of the CSTIM technique, such as its ability t...

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
NUCLEAR INSTRUMENTS and METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume:
118
Issue:
1-4
Pages:
426-430
Publication date:
1996-09-01
Event title:
12th International Conference on Ion Beam Analysis (IBA-12)
DOI:
ISSN:
0168-583X
Source identifiers:
23253
Keywords:
Pubs id:
pubs:23253
UUID:
uuid:f799382a-5ba7-43e0-98d1-a3d45811cff8
Local pid:
pubs:23253
Deposit date:
2012-12-19

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