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Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectra.

Abstract:

The electronic structure of hexagonal GaN is studied using two simulation techniques in order to develop a method to interpret the fine-structure of an experimental nitrogen K-edge electron energy loss spectrum obtained using a scanning transmission electron microscope. The application of these simulation methods to the bulk spectrum is a necessary first step in developing a fundamental understanding of the effect of changes in the electronic structure on the properties of defects. It is foun...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Micron (Oxford, England : 1993)
Volume:
34
Issue:
3-5
Pages:
255-260
Publication date:
2003-01-01
Event title:
Microscopy and Microanalysis 2002 Meeting
DOI:
EISSN:
1878-4291
ISSN:
0968-4328
Source identifiers:
19570
Keywords:
Pubs id:
pubs:19570
UUID:
uuid:f71275a6-37a8-4a96-a7c0-08cbb4fa00ec
Local pid:
pubs:19570
Deposit date:
2012-12-19

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