Conference item
Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectra.
- Abstract:
-
The electronic structure of hexagonal GaN is studied using two simulation techniques in order to develop a method to interpret the fine-structure of an experimental nitrogen K-edge electron energy loss spectrum obtained using a scanning transmission electron microscope. The application of these simulation methods to the bulk spectrum is a necessary first step in developing a fundamental understanding of the effect of changes in the electronic structure on the properties of defects. It is foun...
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- Publication status:
- Published
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- Publisher copy:
- 10.1016/s0968-4328(03)00036-2
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Bibliographic Details
- Journal:
- Micron (Oxford, England : 1993)
- Volume:
- 34
- Issue:
- 3-5
- Pages:
- 255-260
- Publication date:
- 2003-01-01
- Event title:
- Microscopy and Microanalysis 2002 Meeting
- DOI:
- EISSN:
-
1878-4291
- ISSN:
-
0968-4328
- Source identifiers:
-
19570
Item Description
- Keywords:
- Pubs id:
-
pubs:19570
- UUID:
-
uuid:f71275a6-37a8-4a96-a7c0-08cbb4fa00ec
- Local pid:
- pubs:19570
- Deposit date:
- 2012-12-19
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- Copyright date:
- 2003
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