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Electronic structure at realistic Si(100)-SiO2 interfaces

Publication status:
Published

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Publisher copy:
10.1143/JJAP.43.7895
Host title:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES and REVIEW PAPERS
Volume:
43
Issue:
11B
Pages:
7895-7898
Publication date:
2004-11-01
DOI:
EISSN:
1347-4065
ISSN:
0021-4922
Keywords:
Pubs id:
pubs:173000
UUID:
uuid:f6449827-fd40-46d1-9f4b-b748b594b11c
Local pid:
pubs:173000
Source identifiers:
173000
Deposit date:
2012-12-19

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