Journal article

Residual elastic strain due to laser shock peening: synchrotron diffraction measurement

Publication status:: Published

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APA Style

Korsunsky, A., Liu, J., Laundy, D., Golshan, M., & Kim, K. (2006). Residual elastic strain due to laser shock peening: synchrotron diffraction measurement. JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN, 41(2), 113–120.

MLA Style

Korsunsky, A, et al. “Residual Elastic Strain Due to Laser Shock Peening: Synchrotron Diffraction Measurement.” JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN, vol. 41, no. 2, 2006, pp. 113–20.

Chicago Style

Korsunsky, A, J Liu, D Laundy, M Golshan, and K Kim. 2006. “Residual Elastic Strain Due to Laser Shock Peening: Synchrotron Diffraction Measurement.” JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN 41 (2): 113–20.
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Publisher copy:: 10.1243/03093247JSA139

Authors

+ Korsunsky, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Engineering Science
Role:: Author

+ Liu, J More by this author

Role:: Author

+ Laundy, D More by this author

Role:: Author

+ Golshan, M More by this author

Role:: Author

+ Kim, K More by this author

Role:: Author

Journal:: JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN More from this journal
Volume:: 41
Issue:: 2
Pages:: 113-120
Publication date:: 2006-02-01
DOI:: 10.1243/03093247JSA139
EISSN:: 2041-3130
ISSN:: 0309-3247

Keywords:: strain mapping

synchrotron

energy-dispersive diffraction
Pubs id:: pubs:63312
UUID:: uuid:f5aaa483-f421-4b2b-9ab7-cab8ff456000
Local pid:: pubs:63312
Source identifiers:: 63312
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_f5aaa483f4214b2b9ab7cab8ff456000

Terms of use

Copyright date:: 2006

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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