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SIGN CONVENTIONS IN ELECTRON-DIFFRACTION AND IMAGING

Publication status:: Published

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APA Style

Saxton, W., Okeefe, M., Cockayne, D., & Wilkens, M. (1984). SIGN CONVENTIONS IN ELECTRON-DIFFRACTION AND IMAGING. ULTRAMICROSCOPY, 12(1-2), 75–78.

MLA Style

Saxton, W, et al. “SIGN CONVENTIONS IN ELECTRON-DIFFRACTION AND IMAGING.” ULTRAMICROSCOPY, vol. 12, nos. 1-2, 1984, pp. 75–78.

Chicago Style

Saxton, W, M Okeefe, D Cockayne, and M Wilkens. 1984. “SIGN CONVENTIONS IN ELECTRON-DIFFRACTION AND IMAGING.” ULTRAMICROSCOPY 12 (1-2): 75–78.
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Publisher copy:: 10.1016/0304-3991(83)90308-X

Authors

+ Saxton, W More by this author

Role:: Author

+ Okeefe, M More by this author

Role:: Author

+ Cockayne, D More by this author

Role:: Author

+ Wilkens, M More by this author

Role:: Author

Journal:: ULTRAMICROSCOPY More from this journal
Volume:: 12
Issue:: 1-2
Pages:: 75-78
Publication date:: 1984-01-01
DOI:: 10.1016/0304-3991(83)90308-X
ISSN:: 0304-3991

Pubs id:: pubs:5890
UUID:: uuid:f474b233-7334-4f3e-a3e9-0ecde3475088
Local pid:: pubs:5890
Source identifiers:: 5890
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_f474b23373344f3ea3e90ecde3475088

Terms of use

Copyright date:: 1984

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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