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Journal article

Direct sub-angstrom imaging of a crystal lattice.

Abstract:

Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allow...

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Publication status:
Published

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Publisher copy:
10.1126/science.1100965

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Chisholm, MF More by this author
Krivanek, OL More by this author
Murfitt, MF More by this author
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Journal:
Science (New York, N.Y.)
Volume:
305
Issue:
5691
Pages:
1741
Publication date:
2004-09-05
DOI:
EISSN:
1095-9203
ISSN:
0036-8075
URN:
uuid:f43ef44f-4cdc-4229-bb82-6f197f20bf64
Source identifiers:
23236
Local pid:
pubs:23236
Language:
English

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