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Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples

Abstract:
The prediction of Debye-Scherrer diffraction patterns from strained samples is typically conducted in the small strain limit. Although valid for small deviations from the hydrostat (such as the conditions of finite strength typically observed in diamond anvil cells) this assertion is likely to fail for the large strain anisotropies (often of order 10% in normal strain) such as those found in uniaixally loaded dynamic compression experiments. In this paper we derive a general form for the (\theta_B, \phi) dependence of the diffraction for an arbitrarily deformed sample in arbitrary geometry. We show that this formula is consistent with ray traced diffraction for highly strained computationally generated polycrystals, and that the formula shows deviations from the small strain solutions previously reported.
Publication status:
Published

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Publisher copy:
10.1063/1.4874656

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author


Publisher:
American Institute of Physics Inc.
Journal:
JOURNAL OF APPLIED PHYSICS More from this journal
Volume:
115
Issue:
17
Pages:
174906-174906
Publication date:
2013-08-22
DOI:
EISSN:
1089-7550
ISSN:
0021-8979


Language:
English
Keywords:
Pubs id:
pubs:443692
UUID:
uuid:f42cb028-0e0c-4253-a337-d97bf8738566
Local pid:
pubs:443692
Source identifiers:
443692
Deposit date:
2014-02-08
ARK identifier:

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