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In situ characterization of an optically thick atom-filled cavity

Abstract:

A means for precise experimental characterization of the dielectric susceptibility of an atomic gas inside an optical cavity is important for the design and operation of quantum light-matter interfaces, particularly in the context of quantum information processing. Here we present a numerically optimized theoretical model to predict the spectral response of an atom-filled cavity, accounting for both homogeneous and inhomogeneous broadening at high optical dens...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1103/PhysRevA.93.013858

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
ORCID:
0000-0002-3431-3836
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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Oxford college:
Magdalen College
Role:
Author
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Institution:
University of Oxford
Division:
University Administration and Services
Department:
Vice-chancellor & Registrar
Sub department:
University Officers
Oxford college:
St Hugh's College
Role:
Author
ORCID:
0000-0002-4714-0575
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Name:
European Research Council
Grant:
MOQUACINO
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Name:
China Scholarship Council
Grant:
201406140039
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Name:
Engineering & Physical Sciences Research Council
Grant:
EP/J000051/1
Publisher:
American Physical Society
Journal:
Physical Review A More from this journal
Volume:
93
Issue:
1
Publication date:
2016-01-29
DOI:
EISSN:
2469-9934
ISSN:
2469-9926
Keywords:
Pubs id:
pubs:605517
UUID:
uuid:f23e4adf-be6c-4ab8-96ea-0e263a431685
Local pid:
pubs:605517
Source identifiers:
605517
Deposit date:
2018-09-01

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