STRUCTURE OF THIN DEUTERATED POLY(METHYL METHACRYLATE) FILMS STUDIED BY THE SPECULAR REFLECTION OF NEUTRONS

Journal article

The structure of thin deuterated poly(methyl methacrylate) (d-PMMA) films has been investigated by using the specular reflection of neutrons. On annealing, all the spin-cast samples became thinner and denser. For films less than 100 nm thick the final density is up to 6% greater than the bulk value. Films thicker than 95 nm showed an increasing density gradient towards the surface. For films thinner than 100 nm this density gradient is retained even after annealing at a temperature above the Tg of the d-PMMA. However, for the thicker films, annealing removed the density gradient. These effects appear to correlate with the film thickness and are independent of molecular weight and polydispersity of the d-PMMA and of the type of substrate or solvent.

Authors: Fernandez, M; Higgins, J; Penfold, J; Shackleton, C

• Publication status: Published
• Journal: POLYMER COMMUNICATIONS
• Volume: 31
• Issue: 4
• Pages: 124-127
• Publication date: 1990-04-01
• ISSN: 0263-6476
• Language: English