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Energy-Filtered imaging of Cu-nanoprecipitates

Abstract:
Energy-Filtered (EF) TEM imaging has been used to reveal and measure the size of individual Cu-precipitates as small as 2nm embedded in ferritic steels. Optimisation of the acquisition and analysis procedures is described. A procedure was developed to identify the contributions to spatial resolution limit from fundamental factors, drift and instrument instabilities. A long data acquisition time is necessary during which drift occurs that ultimately limits detection. Nevertheless, EFTEM provides a viable method for revealing the precipitation.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
ELECTRON MICROSCOPY AND ANALYSIS 2003 More from this journal
Volume:
179
Issue:
179
Pages:
241-244
Publication date:
2004-01-01
Event title:
Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)
ISSN:
0951-3248
ISBN:
0750309679


Keywords:
Pubs id:
pubs:27046
UUID:
uuid:f037020b-ce5c-4c21-88dd-5a8e062292bf
Local pid:
pubs:27046
Source identifiers:
27046
Deposit date:
2012-12-19
ARK identifier:

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