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Journal article

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Publisher:
Inst of Physics
Journal:
INSTITUTE OF PHYSICS CONFERENCE SERIES
Issue:
67
Pages:
109-114
Publication date:
1983-01-01
ISSN:
0951-3248
URN:
uuid:ee9b3d16-d98c-4aa8-adec-89b95f66fc47
Source identifiers:
991
Local pid:
pubs:991
Language:
English

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