Journal article

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Publication status:: Published

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APA Style

Grovenor, C., Cerezo, A., & Smith, G. (1983). FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. INSTITUTE OF PHYSICS CONFERENCE SERIES, 67, 109–114.

MLA Style

Grovenor, C., et al. “FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS.” INSTITUTE OF PHYSICS CONFERENCE SERIES, no. 67, Inst of Physics, 1983, pp. 109–14.

Chicago Style

Grovenor, C, A Cerezo, and G Smith. 1983. “FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS.” INSTITUTE OF PHYSICS CONFERENCE SERIES, no. 67: 109–14.
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Authors

+ Grovenor, C More by this author

Role:: Author

+ Cerezo, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Smith, G More by this author

Role:: Author

Publisher:: Inst of Physics
Journal:: INSTITUTE OF PHYSICS CONFERENCE SERIES More from this journal
Issue:: 67
Pages:: 109-114
Publication date:: 1983-01-01
ISSN:: 0951-3248

Language:: English
Pubs id:: pubs:991
UUID:: uuid:ee9b3d16-d98c-4aa8-adec-89b95f66fc47
Local pid:: pubs:991
Source identifiers:: 991
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1983

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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