X-ray crystallography and chirality: understanding the limitations

Journal article

Advances in hardware and software have made X-ray crystallography even more attractive as the first-option method for structure analysis. For most organic materials containing up to 100 non-hydrogen atoms, getting from the initial visual examination of the sample to producing publication-ready tables and pictures should usually be achievable in a single morning. Improvements in hardware have also increased reliability of the determination of absolute configuration. A recently published new algorithm may extend the range of applicability of the method. © 2009 Elsevier Ltd. All rights reserved.

Authors: Thompson, A; Watkin, D

• Publication status: Published
• Journal: TETRAHEDRON-ASYMMETRY
• Volume: 20
• Issue: 6-8
• Pages: 712-717
• Publication date: 2009-05-07
• DOI: 10.1016/j.tetasy.2009.02.025
• EISSN: 1362-511X
• ISSN: 0957-4166
• Language: English