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X-ray crystallography and chirality: understanding the limitations

Abstract:

Advances in hardware and software have made X-ray crystallography even more attractive as the first-option method for structure analysis. For most organic materials containing up to 100 non-hydrogen atoms, getting from the initial visual examination of the sample to producing publication-ready tables and pictures should usually be achievable in a single morning. Improvements in hardware have also increased reliability of the determination of absolute configuration. A recently published new al...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Inorganic Chemistry
Role:
Author
Journal:
TETRAHEDRON-ASYMMETRY
Volume:
20
Issue:
6-8
Pages:
712-717
Publication date:
2009-05-07
DOI:
EISSN:
1362-511X
ISSN:
0957-4166
URN:
uuid:eda5bf17-0b76-405f-87e2-d4c8e8038726
Source identifiers:
41166
Local pid:
pubs:41166
Language:
English

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