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CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY

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APA Style

Zou, J., Usher, B., Cockayne, D., & Glaisher, R. (1991). CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY. SYMP AT THE 1991 ANNUAL MEETING OF THE MINERALS, METALS AND MATERIALS SOC : STRAIN RELAXATION IN EPITAXIAL FILMS, 20(10), 855–859.

MLA Style

Zou, J, et al. “CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY.” SYMP AT THE 1991 ANNUAL MEETING OF THE MINERALS, METALS AND MATERIALS SOC : STRAIN RELAXATION IN EPITAXIAL FILMS, vol. 20, no. 10, 1991, pp. 855–59.

Chicago Style

Zou, J, B Usher, D Cockayne, and R Glaisher. 1991. “CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY.” In SYMP AT THE 1991 ANNUAL MEETING OF THE MINERALS, METALS AND MATERIALS SOC : STRAIN RELAXATION IN EPITAXIAL FILMS, 20:855–59.
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Publisher copy:: 10.1007/BF02665974

Authors

+ Zou, J More by this author

Role:: Author

+ Usher, B More by this author

Role:: Author

+ Cockayne, D More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Glaisher, R More by this author

Role:: Author

Journal:: JOURNAL OF ELECTRONIC MATERIALS More from this journal
Volume:: 20
Issue:: 10
Pages:: 855-859
Publication date:: 1991-10-01
Event title:: SYMP AT THE 1991 ANNUAL MEETING OF THE MINERALS, METALS AND MATERIALS SOC : STRAIN RELAXATION IN EPITAXIAL FILMS
DOI:: 10.1007/BF02665974
EISSN:: 1543-186X
ISSN:: 0361-5235

Keywords:: INXGA1-XAS/GAAS

TRANSMISSION ELECTRON MICROSCOPY

CRITICAL THICKNESS

MISFIT DISLOCATION

STRAINED-LAYER SYSTEM
Pubs id:: pubs:19392
UUID:: uuid:ed74c5e8-a0f4-4871-8499-5558b19fd8ae
Local pid:: pubs:19392
Source identifiers:: 19392
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_ed74c5e8a0f4487184995558b19fd8ae

Terms of use

Copyright date:: 1991

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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