Journal article
Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass
- Abstract:
- We report on the characterization of the growth of vacuum-deposited zinc phthalocyanine (ZnPc) thin films on glass through a combination of in situ grazing incidence x-ray scattering, x-ray reflectivity, and atomic force microscopy. We found that the growth at room temperature proceeds via the formation of two structurally unique substrate-induced interfacial layers, followed by the growth of the γ -ZnPc polymorph thereafter (thickness ≈ 1.0 nm). As the growth of the bulk γ -ZnPc progresses, a substantial out-of-plane lattice strain ( ≈ 15 % relative to γ -ZnPc powder) is continually relaxed during the thin film growth. The rate of strain relaxation was slowed after a thickness of ≈ 13 nm, corresponding to the transition from layer growth to island growth. The findings reveal the real-time microstructural evolution of ZnPc and highlight the importance of substrate-induced strain on thin film growth.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Version of record, 2.9MB, Terms of use)
-
- Publisher copy:
- 10.1103/physrevmaterials.6.033401
Authors
- Publisher:
- American Physical Society
- Journal:
- Physical Review Materials More from this journal
- Volume:
- 6
- Issue:
- 3
- Article number:
- 033401
- Publication date:
- 2022-03-08
- Acceptance date:
- 2022-02-15
- DOI:
- EISSN:
-
2475-9953
- Language:
-
English
- Keywords:
- Pubs id:
-
1248906
- Local pid:
-
pubs:1248906
- Deposit date:
-
2022-03-30
Terms of use
- Copyright holder:
- American Physical Society
- Copyright date:
- 2022
- Rights statement:
- Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.
- Licence:
- CC Attribution (CC BY)
If you are the owner of this record, you can report an update to it here: Report update to this record