Journal article
Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling.
- Abstract:
-
The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys containing cracks is usually thwarted by the difficulty in preventing preferential erosion of material along the flanks and at the tips of cracks. Recent developments in focused ion beam (FIB) micromachining methods have the potential to overcome this inherent problem. In this article we describe the development of new procedures, one using FIB alone and the other using a combination of FIB with mo...
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- Publication status:
- Published
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Bibliographic Details
- Journal:
- Journal of microscopy More from this journal
- Volume:
- 207
- Issue:
- Pt 2
- Pages:
- 129-136
- Publication date:
- 2002-08-01
- DOI:
- EISSN:
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1365-2818
- ISSN:
-
0022-2720
Item Description
- Language:
-
English
- Keywords:
- Pubs id:
-
pubs:15396
- UUID:
-
uuid:ea86204d-c824-42e3-8984-8f018ece40b6
- Local pid:
-
pubs:15396
- Source identifiers:
-
15396
- Deposit date:
-
2012-12-19
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- Copyright date:
- 2002
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