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Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy

Publication status:: Published

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APA Style

Kolosov, O., Castell, M., Marsh, C., Briggs, G., Kamins, T., & Williams, R. (1998). Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy. Physical Review Letters, 81(5), 1046–1049.

MLA Style

Kolosov, O., et al. “Imaging the Elastic Nanostructure of Ge Islands by Ultrasonic Force Microscopy.” Physical Review Letters, vol. 81, no. 5, 1998, pp. 1046–49.

Chicago Style

Kolosov, O, M Castell, C Marsh, G Briggs, T Kamins, and R Williams. 1998. “Imaging the Elastic Nanostructure of Ge Islands by Ultrasonic Force Microscopy.” Physical Review Letters 81 (5): 1046–49.
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Publisher copy:: 10.1103/PhysRevLett.81.1046

Authors

+ Kolosov, O More by this author

Role:: Author

+ Castell, M More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Marsh, C More by this author

Role:: Author

+ Briggs, G More by this author

Role:: Author

+ Kamins, T More by this author

Role:: Author

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Journal:: Physical Review Letters More from this journal
Volume:: 81
Issue:: 5
Pages:: 1046-1049
Publication date:: 1998-08-03
DOI:: 10.1103/PhysRevLett.81.1046
EISSN:: 1079-7114
ISSN:: 0031-9007

Pubs id:: pubs:3812
UUID:: uuid:e9debbed-769b-49aa-bcf9-a8993506d932
Local pid:: pubs:3812
Source identifiers:: 3812
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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