Conference item icon

Conference item

Microanalysis at the atomic level

Abstract:

The optical arrangement of the high-resolution scanning transmission electron microscope (STEM) allows incoherent imaging conditions to be established simultaneously for both elastically and inelastically scattered electrons, with good detection efficiencies. For zone axis illumination and localized inelastic transitions, both images show a resolution governed by the incident probe intensity profile, with maximum intensity occuring when the probe is located over the atomic columns. The high i...

Expand abstract
Publication status:
Published

Actions


Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
ELECTRON MICROSCOPY AND ANALYSIS 1995 More from this journal
Volume:
147
Pages:
17-24
Publication date:
1995-01-01
Event title:
Institute-of-Physics Electron-Microscopy-and-Analysis-Group Conference
ISSN:
0951-3248
ISBN:
0750303573
Keywords:
Pubs id:
pubs:24858
UUID:
uuid:e9850744-1d2c-49f6-ac3f-9956e3cb7579
Local pid:
pubs:24858
Source identifiers:
24858
Deposit date:
2012-12-19

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP