Microanalysis at the atomic level

Conference item

Abstract:: The optical arrangement of the high-resolution scanning transmission electron microscope (STEM) allows incoherent imaging conditions to be established simultaneously for both elastically and inelastically scattered electrons, with good detection efficiencies. For zone axis illumination and localized inelastic transitions, both images show a resolution governed by the incident probe intensity profile, with maximum intensity occuring when the probe is located over the atomic columns. The high intensity elastic signal may therefore be used as an atomic resolution reference image for the low intensity inelastic signal, allowing spectroscopy to be achieved from selected atomic columns or planes. The potential of this approach in a 300-kV STEM is discussed.

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Journal:: ELECTRON MICROSCOPY AND ANALYSIS 1995 More from this journal
Volume:: 147
Pages:: 17-24
Publication date:: 1995-01-01
Event title:: Institute-of-Physics Electron-Microscopy-and-Analysis-Group Conference
ISSN:: 0951-3248
ISBN:: 0750303573

Keywords:: CRYSTALS

SCATTERING

ENERGY LOSS SPECTROSCOPY

IONIZATION

ELECTRON-MICROSCOPY
Pubs id:: pubs:24858
UUID:: uuid:e9850744-1d2c-49f6-ac3f-9956e3cb7579
Local pid:: pubs:24858
Source identifiers:: 24858
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_e98507441d2c49f6ac3f9956e3cb7579

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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