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Spin lifetimes in quantum dots from noise measurements.

Abstract:

We present a method of obtaining information about spin lifetimes in quantum dots from measurements of electrical transport. The dot is under resonant microwave irradiation and at temperatures comparable to or larger than the Zeeman energy. We find that the ratio of the spin coherence times T_{1}/T_{2} can be deduced from a measurement of current through the quantum dot as a function the applied magnetic field. We calculate the noise power spectrum of the dot current and show that a dip occur...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Jefferson, JH More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
Physical review letters
Volume:
102
Issue:
1
Pages:
016802
Publication date:
2009-01-05
DOI:
EISSN:
1079-7114
ISSN:
0031-9007
URN:
uuid:e983f904-89b9-4942-8a66-ed451217c721
Source identifiers:
28651
Local pid:
pubs:28651
Language:
English

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