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Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography

Abstract:

When subjected to plastic deformation, grains within ductile face-centred cubic polycrystals fragment into "soft", low dislocation density cells separated by "hard", dislocation-rich walls. Using a narrow-bandwidth, sub-micrometre X-ray beam, we have mapped the deformation structure inside a single grain within a deformed Ni polycrystal. Dislocation multiplication and entanglement was found to vary depending on the physical dimensions of the grain. The method we use overcomes current limitati...

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Journal:
SCRIPTA MATERIALIA
Volume:
64
Issue:
9
Pages:
884-887
Publication date:
2011-05-01
DOI:
ISSN:
1359-6462
Source identifiers:
132471
Language:
English
Keywords:
Pubs id:
pubs:132471
UUID:
uuid:e8ecc88d-7319-4122-8d58-6797017c9778
Local pid:
pubs:132471
Deposit date:
2012-12-19

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