Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography

Journal article

When subjected to plastic deformation, grains within ductile face-centred cubic polycrystals fragment into "soft", low dislocation density cells separated by "hard", dislocation-rich walls. Using a narrow-bandwidth, sub-micrometre X-ray beam, we have mapped the deformation structure inside a single grain within a deformed Ni polycrystal. Dislocation multiplication and entanglement was found to vary depending on the physical dimensions of the grain. The method we use overcomes current limitations in classical X-ray topography allowing topographic images to be formed from small, highly deformed grains. © 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Authors: Abbey, B; Hofmann, F; Belnoue, J; Rack, A; Tucoulou, R

• Publication status: Published
• Journal: SCRIPTA MATERIALIA
• Volume: 64
• Issue: 9
• Pages: 884-887
• Publication date: 2011-05-01
• DOI: 10.1016/j.scriptamat.2011.01.024
• ISSN: 1359-6462
• Language: English
• Keywords: Dislocation-structure; Thin films; X-ray diffraction (XRD); Synchrotron radiation; Tension test