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Optical cavity efficacy and lasing of focused ion beam milled GaN/InGaN micropillars

Abstract:

Focused ion beam milled micropillars employing upper and lower distributed Bragg reflectors (DBRs) and incorporating InGaN quantum dots were analysed both microstructurally and optically. Comparison of the surface characteristics and the optical resonance of pillars milled employing two recipes, using comparatively higher and lower beam currents, were carried out through electron back scatter diffraction, atomic force microscopy and low temperature micro-photoluminescence. Low temperature mic...

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Publication status:
Published

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Publisher copy:
10.1063/1.4768442

Authors


El-Ella, HAR More by this author
Collins, DP More by this author
Kappers, MJ More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
Oliver, RA More by this author
Journal:
JOURNAL OF APPLIED PHYSICS
Volume:
112
Issue:
11
Pages:
113516-113516
Publication date:
2012-12-01
DOI:
ISSN:
0021-8979
URN:
uuid:e8e80246-f8e7-47f2-8076-ee36f0839b5f
Source identifiers:
371517
Local pid:
pubs:371517
Language:
English

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