Journal article
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions
- Abstract:
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Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is useful to determine the composition and thickness of nanostructures at the atomic scale. However, significant difficulties remain to quantify mixed columns by comparing the resulting atomic resolution images and spectroscopy data with multislice simulations where dynamic scattering needs to be taken into account. The combination of the ...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 5.4MB, Terms of use)
-
- Publisher copy:
- 10.1016/j.ultramic.2022.113671
Authors
Bibliographic Details
- Publisher:
- Elsevier
- Journal:
- Ultramicroscopy More from this journal
- Volume:
- 246
- Article number:
- 113671
- Place of publication:
- Netherlands
- Publication date:
- 2022-12-28
- Acceptance date:
- 2022-12-26
- DOI:
- EISSN:
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1879-2723
- ISSN:
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0304-3991
- Pmid:
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36621195
Item Description
- Language:
-
English
- Keywords:
- Pubs id:
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1324718
- Local pid:
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pubs:1324718
- Deposit date:
-
2023-03-28
Terms of use
- Copyright holder:
- Elsevier B.V.
- Copyright date:
- 2023
- Rights statement:
- © 2023 Elsevier B.V. All rights reserved.
- Notes:
-
This is the accepted manuscript version of the article. The final version is available from Elsevier at: 10.1016/j.ultramic.2022.113671
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