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Method and system for tracking sinusoidal wave parameters from a received signal that includes noise

Alternative title:
Patent #US11790034B2
Documentation:
A system for tracking selected wave parameters from a received sinusiodal wave with noise and methods for making and using the same. The method includes performing a multi-track double integral analysis of the sinusoidal wave with noise and creating time dependent outputs. These time dependent outputs may be analyzed mathematically to determine the amplitude, frequency and/or phase of the wave with reduced noise. In one embodiment, the method may employ multiple passes through double integral analysis. The method advantageously can measure output sinusoidal wave parameters with reduced noise, measurements that are close to theoretical noise reduction limits.

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author


Publisher:
United States Patent and Trademark Office
Publication date:
2023-10-17
Patent number:
US 11,790,034 B2
Patent status:
Issued/granted


Language:
English
Pubs id:
pubs:853727
UUID:
uuid:e7758f70-6d4f-40a8-ba2d-5e9fddafaaf7
Local pid:
pubs:853727
Source identifiers:
853727
Deposit date:
2018-05-24

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