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Engineering helimagnetism in MnSi thin films

Abstract:
Magnetic skyrmion materials have the great advantage of a robust topological magnetic structure, which makes them stable against the superparamagnetic effect and therefore a candidate for the next-generation of spintronic memory devices. Bulk MnSi, with an ordering temperature of 29.5 K, is a typical skyrmion system with a propagation vector periodicity of ∼18 nm. One crucial prerequisite for any kind of application, however, is the observation and precise control of skyrmions in thin films at room-temperature. Strain in epitaxial MnSi thin films is known to raise the transition temperature to 43 K. Here we show, using magnetometry and x-ray spectroscopy, that the transition temperature can be raised further through proximity coupling to a ferromagnetic layer. Similarly, the external field required to stabilize the helimagnetic phase is lowered. Transmission electron microscopy with element-sensitive detection is used to explore the structural origin of ferromagnetism in these Mn-doped substrates. Our work suggests that an artificial pinning layer, not limited to the MnSi/Si system, may enable room temperature, zero-field skyrmion thin-film systems, thereby opening the door to device applications.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/1.4941316

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author


Publisher:
American Institute of Physics
Journal:
AIP Advances More from this journal
Volume:
6
Article number:
015217
Publication date:
2016-01-29
Acceptance date:
2016-01-15
DOI:
ISSN:
2158-3226


Pubs id:
pubs:590354
UUID:
uuid:e6bfa538-4e5e-4bc8-9bee-8fd77119999a
Local pid:
pubs:590354
Source identifiers:
590354
Deposit date:
2016-01-16

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