Journal article

Analysis of ramped square−wave voltammetry in the frequency domain

Abstract:: We present a new approach to the analysis of square-wave voltammetry in the frequency domain. By extending our earlier work (J. Electroanal. Chem. 480 (2000) 133) on the numerical simulation of ac sine wave voltammetry, we are able to solve the governing equations when a square waveform of any amplitude is superimposed onto a linearly varying dc potential which is swept at a finite scan rate. By considering the numerical results in the frequency domain by using the fast Fourier transform (FFT) method, we are able to develop a very simple and general form of analysis which will theoretically allow consideration of reaction phenomena over a very wide range of timescales using a single potential sweep.

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APA Style

Gavaghan, D., Elton, D., Oldham, K., & Bond, A. (2001). Analysis of ramped square−wave voltammetry in the frequency domain. Journal of Electroanalytical Chemistry, 512(1), 1–15.

MLA Style

Gavaghan, D, et al. “Analysis of Ramped Square−Wave Voltammetry in the Frequency Domain.” Journal of Electroanalytical Chemistry, vol. 512, no. 1, 2001, pp. 1–15.

Chicago Style

Gavaghan, D, D Elton, K Oldham, and A Bond. 2001. “Analysis of Ramped Square−Wave Voltammetry in the Frequency Domain.” Journal of Electroanalytical Chemistry 512 (1): 1–15.
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Authors

+ Gavaghan, D More by this author

Role:: Author

+ Elton, D More by this author

Role:: Author

+ Oldham, K More by this author

Role:: Author

+ Bond, A More by this author

Role:: Author

Journal:: Journal of Electroanalytical Chemistry More from this journal
Volume:: 512
Issue:: 1
Pages:: 1-15
Publication date:: 2001-01-01

UUID:: uuid:e4afed8b-4c17-4ca1-9bdc-8722b0666bca
Local pid:: cs:4275
Deposit date:: 2015-03-31
ARK identifier:: ark:/29072/ora_e4afed8b4c174ca19bdc8722b0666bca

Terms of use

Copyright date:: 2001

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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