Siliceous zeolite-derived topology of amorphous silica

Journal article

Abstract The topology of amorphous materials can be affected by mechanical forces during compression or milling, which can induce material densification. Here, we show that densified amorphous silica (SiO2) fabricated by cold compression of siliceous zeolite (SZ) is permanently densified, unlike densified glassy SiO2 (GS) fabricated by cold compression although the X-ray diffraction data and density of the former are identical to those of the latter. Moreover, the topology of the densified amorphous SiO2 fabricated from SZ retains that of crystalline SZ, whereas the densified GS relaxes to pristine GS after thermal annealing. These results indicate that it is possible to design new functional amorphous materials by tuning the topology of the initial zeolitic crystalline phases

Authors: Masai, H; Kohara, S; Wakihara, T; Shibazaki, Y; Onodera, Y

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: Nature Research
• Journal: Communications Chemistry
• Volume: 6
• Issue: 1
• Pages: 269-269
• Article number: 269
• Publication date: 2023-12-09
• DOI: 10.1038/s42004-023-01075-1
• EISSN: 2399-3669
• ISSN: 2399-3669
• Language: English
• Keywords: Annealing (glass); Topology (electrical circuits); Crystallography; Physics; Diffraction; Chemistry; Amorphous silica; Composite material; Catalysis; Amorphous solid; Materials science; Nanotechnology; Organic chemistry; Compression (physics); Zeolite; Chemical engineering; Optics