Conference icon

Conference

Microstructural studies of Tl2Ba2Ca2Cu3Ox thin films on LaAlO3 and MgO substrates.

Abstract:

Tl(2)Ba2Ca(2)Cu(3)O(x) thin films have been fabricated on (001) LaAlO3 and (001) MgO substrates. Films grown on LaAlO3 have T-c=112K and R-s(80K, 10GHz)=0.2m Ohm, while films on MgO have T-c=117K and R-s(80K; 10GHz)=0.7m Ohm. The grain size and alignment of the Alms has been investigated using X-ray diffraction, Scanning Electron Microscopy and Electron Backscattered Diffraction. We show evidence for a markedly higher in-plane angular spread for films on MgO and believe that for films grown o...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1023/A:1022685913672

Authors


Bramley, AP More by this author
Wilkinson, AJ More by this author
Jenkins, AP More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Volume:
11
Issue:
1
Pages:
71-72
Publication date:
1998-02-05
DOI:
ISSN:
0896-1107
URN:
uuid:e1352e0b-58bb-426b-88b9-d6651856d3ba
Source identifiers:
28030
Local pid:
pubs:28030

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP