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Quantum-path-sensitive inline XUV interferometry

Abstract:
An XUV interferometer composed of two inline high harmonic generation regions is used to characterize different ionized electron quantum paths. We unambiguously observe interference between long and short trajectories, revealing their attosecond-scale relative timing.
Publication status:
Published
Peer review status:
Reviewed (other)
Version:
Accepted Manuscript

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Publisher copy:
10.1364/HILAS.2018.HW2A.2

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Institution:
University of Oxford
Division:
MPLS Division
Department:
Physics; Atomic and Laser Physics
ORCID:
0000-0002-4187-6557
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Physics; Atomic and Laser Physics
ORCID:
0000-0001-8625-6709
Chapman, R More by this author
Thornton, C More by this author
Majchrzak, P More by this author
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Publisher:
Optical Society of America Publishing Publisher's website
Publication date:
2018-03-29
Acceptance date:
2018-01-08
DOI:
Pubs id:
pubs:856242
URN:
uri:e036b367-4eb4-4df6-b16a-4fd055bbf5db
UUID:
uuid:e036b367-4eb4-4df6-b16a-4fd055bbf5db
Local pid:
pubs:856242
ISBN:
9781943580408

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