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Cryogenic ion trap system for high-fidelity near-field microwave-driven quantum logic

Abstract:
We report the design, fabrication, and characterization of a cryogenic ion trap system for the implementation of quantum logic driven by near-field microwaves. The trap incorporates an on-chip microwave resonator with an electrode geometry designed to null the microwave field component that couples directly to the qubit, while giving a large field gradient for driving entangling logic gates. We map the microwave field using a single 43Ca+ ion, and measure the ion trapping lifetime and motional mode heating rates for one and two ions.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1088/2058-9565/acfba8

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author


Publisher:
IOP Publishing
Journal:
Quantum Science and Technology More from this journal
Volume:
9
Issue:
1
Article number:
015007
Publication date:
2023-10-25
Acceptance date:
2023-07-14
DOI:
EISSN:
2058-9565


Language:
English
Keywords:
Pubs id:
1522258
Local pid:
pubs:1522258
Deposit date:
2023-09-06

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