Conference item
Rotation-free online handwritten character recognition using dyadic path signature features, hanging normalization, and deep neural network
- Abstract:
- The path signature feature (PSF) which was initially introduced in rough paths theory as a branch of stochastic analysis, has recently been successfully applied to the field of pattern recognition for extracting sufficient quantity of information contained in a finite trajectory, but with potentially high dimension. In this paper, we propose a variation of path signature representation, namely the dyadic path signature feature (D-PSF), to fully characterize the trajectory using a hierarchical structure to solve the rotation-free online handwritten character recognition (OLHCR) problem. We adopt the deep neural network (DNN) as classifier, and investigate three hanging normalization methods to improve the robustness of the DNN to rotational distortions. Extensive experiments on digits, English letters, and Chinese radicals demonstrated that the proposed D-PSF, jointly with hanging normalization and DNN, achieved very promising results for rotated OLHCR, significantly outperforming previous methods.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
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(Preview, Accepted manuscript, pdf, 794.8KB, Terms of use)
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- Publisher copy:
- 10.1109/ICPR.2016.7900273
Authors
- Publisher:
- Institute of Electrical and Electronics Engineers
- Host title:
- 23rd International Conference on Pattern Recognition (ICPR 2016)
- Journal:
- 23rd International Conference on Pattern Recognition (ICPR 2016 ) More from this journal
- Publication date:
- 2017-04-01
- Acceptance date:
- 2016-07-11
- DOI:
- ISSN:
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1051-4651
- ISBN:
- 9781509048472
- Keywords:
- Pubs id:
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pubs:698400
- UUID:
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uuid:dd1ec888-c558-4385-8f48-4efcb867b682
- Local pid:
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pubs:698400
- Source identifiers:
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698400
- Deposit date:
-
2017-11-15
Terms of use
- Copyright holder:
- Institute of Electrical and Electronics Engineers
- Copyright date:
- 2017
- Notes:
- ©2016 IEEE
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