Synchrotron based reciprocal space mapping and dislocation substructure analysis

Journal article

During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dislocation cell/wall model capable of computing numerical reciprocal space maps is presented. The model qualitatively captures the experimentally observed features. © 2009 Elsevier B.V. All rights reserved.

Authors: Hofmann, F; Song, X; Eve, S; Collins, SR; Korsunsky, A

• Publication status: Published
• Journal: MATERIALS LETTERS
• Volume: 63
• Issue: 12
• Pages: 1077-1081
• Publication date: 2009-05-15
• DOI: 10.1016/j.matlet.2009.02.014
• ISSN: 0167-577X
• Language: English
• Keywords: Crystal structure; Reciprocal space map; Defects; Dislocation substructure; X-ray techniques; Characterisation methods