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Journal article

Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS.

Abstract:

Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0.3 mm(3) sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10(-4). This configuration is ...

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Publication status:
Published

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Publisher copy:
10.1107/s0909049502001905

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
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Journal:
Journal of synchrotron radiation
Volume:
9
Issue:
Pt 2
Pages:
77-81
Publication date:
2002-03-01
DOI:
EISSN:
1600-5775
ISSN:
0909-0495
Source identifiers:
62410
Language:
English
Keywords:
Pubs id:
pubs:62410
UUID:
uuid:d613ab7a-a5f8-4979-9d42-2368939c2ba0
Local pid:
pubs:62410
Deposit date:
2012-12-19

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